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Comparison
with Optical Imaging |
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In an SEM, incident
electrons are concentrated to a point on the sample in order to have an
image focused. This yields a better depth of focus than an optical microscope.
(Pictures here are 426x426 um) |
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| This picture is focused. | |||||||||
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This picture is
23 micrometers out of the focus plane. |
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| This picture is 78 micrometers our of the focus plane. | |||||||||