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- Samples can only be etched and viewed once, further attempts to etch
will result in imaging problems such as gold flaking and imaging-induced
damage
- Depth profiles can be constructed using parallax only for relatively
large holes
- The diameter of holes increases linearly as a function of etch time
- The SEM can be used to scan an entire piece of CR-39, but factors
such as total scan time decrease its appeal as a new method of scanning
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