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- Develop a more detailed understanding of holes in CR-39 caused by
high energy partcles, in particular how holes evolve as etching occurs
- Study the early stages of etching which cannot be resolved optically
- Compare the SEM's scanning techniques to optical techniques currently
used (e.g., at LLE)
- Use parallax to construct a depth profile of a hole
- Generally explore and investigate interesting features of CR-39
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