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Comparison
with Optical Imaging |
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In
an SEM incident electrons are focused to a point on the sample. This yields
a better depth of view than an optical microscope. |
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| This picture is focused. | ||||||||||
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This
picture is 23 micrometers out of the focus plane. |
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| This picture is 78 micrometers our of the focus plane. | ||||||||||
The SEM could be used to completely scan a piece of CR-39 as done at LLE. The SEM offers the option of saving the pictures at different qualities. Each quality takes a different amount of time, some of which would not be reasonable. (Pictures here are 426x426 um) |
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| <- This is the lowest quality picture. A complete scan of a sample of CR-39 at this quality would take about the same time as a scan at LLE, around 3 hours. | ||||||||||
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A
complete scan at this quality would take about 9 hours.-> |
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| <-A complete scan at this quality would take about a day. | ||||||||||
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A
complete scan at this quality would take two days.-> |
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